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  • 11 months ago

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  • 25 years

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Ion-tof.com

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B9876A78-C14B-4F49-9F4B-396039336A47@1x

About Website

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IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface...

IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis

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Trustworthy

99E6BC28-40D1-4264-B66E-CBC423C983BF@1x

Network Data

This website is hosted with Transferred to the RIPE region on 2018-08-28T00:42:30Z., which reserves the following IP addresses for ion-tof.com: 116.202.200.223. Moreover, DNS used with this website include ns1.dns-service.net, ns3.dns-service.net.

  • 11 months ago

    Last scanned

  • 25 years

    Domain Age

  • No data

    Daily Visitors

  • No data

    Global Rank

Trustworthy

Network

ADDRESSING DETAILS

Whois

OWNERSHIP

Domain & Keywords

The registrar of ion-tof.com is ASCIO TECHNOLOGIES, INC. DANMARK - FILIAL AF ASCIO TECHNOLOGIES, INC. USA and the name expires on 2022-12-06. According to open source data, you can reach the owner at guardian@globe.de but please make sure you have a good reason for unsolicited messages. Their country of residence is Germany.

  • iss
  • leis
  • company
  • products
  • time of flight
  • surface analysis
  • tof-sims
  • secondary ion mass spectrometry
  • depth profiling
  • surface imaging

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